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EQUIPMENT

Scanning Electron Microscope (SEM)

60000x amplification power, secondary electron detector (SE), advanced vacuum, tungsten filament, carousel 7 samples (standard dimensions 10x10x45 mm), VegaTescan software, Alicona-3D analysis software.

Analyzed samples: 

All types of mechanically ground or not polished metal materials, ceramic and polymeric materials (with the recommendation of using a metal surface layer), composite materials, textiles, biological materials, thin films.

Analysis:

Microstructure, surface condition, thin layers, sizing, profilometric analysis by light intensity variation, 3D surface analysis, phase identification by Binary operations, Split RGB, Colomapping, stereotype imaging, 3D imaging, chemical composition.

Chemical Composition Analyzer (EDS)

 

X-flash detector, Esprit 2.1 software, Quantax system - Bruker 

Chemical analysis of metallic and non-metallic materials on macro and micro surfaces. Analysis of the elemental distribution on a surface or on a line. Chemical analysis in Automatic or Element List mode. Point chemical analysis (on an area of ​​0.05 µm), determination of characteristic X-ray energies.

 

Grain Analyzer and Orientation (EBSD)

 

Software Esprit 2.1, Quantax system - Bruker

Integrated phase editor including the visualization of crystallographic structures: supports asymmetric units, supports all crystalline symmetries, generation of atomic positions according to crystallographic spatial groups, 3D display of the crystalline structure and the base cell. Produces phase maps, IPF (inverse pole figures), Euler maps. Grain detection according to criteria related to orientation and dimensions, grain analysis, grain size distribution.

 

ISM-M1000 Namicon Trinocular Inverted Mass Metallographic Microscope + MotiCam Camera specializing in microscopic analysis (OM)

 

10x, 20x, 40x, 60x lens

100x wet lens

Analysis:

Metallic materials microstructure 

Atomic Force Microscope (AFM)

 

Atomic Force Microscopy (AFM) masters topographic imaging, force spectroscopy and lithography in Static Force mode - the fundamental functions for measuring and modifying the surface. It allows easy handling and positioning and has the ability to measure on almost any size and geometry of the sample. 

Analysis:

Surface roughness, interatomic forces, hardness and feedback loops, large-scale integration, corrosion, surface tension and optical limits.

 

 

Phone: +40 742 023 566

E-mail: nicanor.cimpoesu@academic.tuiasi.ro

Address: 41 Prof.dr.doc. D. Mangeron Street, 700050 Iași, Romania

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